V. Santen, L. Schillinger, und H. Amrouch. 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Seite 1-4. Piscataway, IEEE, (2021)
R. Sengupta, I. Polian, und J. Hayes. 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Seite 124-129. Piscataway, IEEE, (2022)