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Wavelet Transform Assisted Neural Networks for Human Activity Recognition

R. Sengupta, I. Polian, and J. Hayes. 2022 IEEE International Symposium on Circuits and Systems (ISCAS), page 1254-1258. IEEE, (2022)
DOI: 10.1109/ISCAS48785.2022.9937939

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John Nixon University of Stuttgart

Isaac Henderson Johnson Jeyakumar University of Stuttgart

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Other publications of authors with the same name

High-level test generation using physically-induced faults.M. Hansen, and J. Hayes. VTS, page 20-28. IEEE Computer Society, (1995)On Realizations of Boolean Functions Requiring a Minimal or Near-Minimal Number of Tests.J. Hayes. IEEE Trans. Computers, 20 (12): 1506-1513 (1971)The Promise and Challenge of Stochastic Computing.A. Alaghi, W. Qian, and J. Hayes. IEEE Trans. on CAD of Integrated Circuits and Systems, 37 (8): 1515-1531 (2018)Realization-independent ATPG for designs with unimplemented blocks.H. Kim, and J. Hayes. IEEE Trans. on CAD of Integrated Circuits and Systems, 20 (2): 290-306 (2001)A Fully Integrated Auto-Calibrated Super-Regenerative Receiver in 0.13-µm CMOS.J. Chen, M. Flynn, and J. Hayes. J. Solid-State Circuits, 42 (9): 1976-1985 (2007)Enumeration of Fanout-Free Boolean Functions.J. Hayes. J. ACM, 23 (4): 700-709 (1976)Scalar-Vector Memory Interference in Vector Computers.R. Raghavan, and J. Hayes. ICPP (1), page 180-187. CRC Press, (1991)Architecture of a Hypercube Supercomputer.J. Hayes, T. Mudge, and Q. Stout. ICPP, page 653-660. IEEE Computer Society Press, (1986)A 3.6mW 2.4-GHz multi-channel super-regenerative receiver in 130nm CMOS.J. Chen, M. Flynn, and J. Hayes. CICC, page 361-364. IEEE, (2005)The input pattern fault model and its application.R. Blanton, and J. Hayes. ED&TC, page 628. IEEE Computer Society, (1997)