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Disambiguation of "Klemme, Florian"

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Design Automation for Cryogenic CMOS Circuits

, , , , , , , and . 2023 60th ACM/IEEE Design Automation Conference (DAC), IEEE, (2023)
DOI: 10.1109/DAC56929.2023.10247824

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Florian Klemme University of Stuttgart

Florian Weiss

PD Dr. -Ing. Florian Bauer University of Stuttgart

Florian Helber University of Stuttgart

Florian Seibold University of Stuttgart

 

Other publications of authors with the same name

Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries, and . IEEE transactions on circuits and systems. 1, Regular papers, 69 (12): 5233-5246 (2022)Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs, and . IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 70 (12): 5366-5379 (2023)Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency, and . IEEE transactions on circuits and systems. 1, Regular papers, 69 (5): 2142-2155 (2022)Design Close to the Edge in Advanced Technology using Machine Learning and Brain-Inspired Algorithms, , and . 27th Asia and South Pacific Design Automation Conference (ASP-DAC'22), (January 2022)Variability-Aware Approximate Circuit Synthesis via Genetic Optimization, , , , , and . IEEE transactions on circuits and systems, 69 (10): 4141-4153 (2022)On Extracting Reliability Information from Speed Binning, , , and . 2022 IEEE European Test Symposium (ETS), Piscataway, IEEE, (2022)GNN4REL : Graph Neural Networks for Predicting Circuit Reliability Degradation, , , , and . 41, 11, page 3826-3837. IEEE, (2022)Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection, , , , and . 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, (2023)Design Automation for Cryogenic CMOS Circuits, , , , , , , and . 2023 60th ACM/IEEE Design Automation Conference (DAC), IEEE, (2023)