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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging., , , , , and . IEEE Trans. VLSI Syst., 27 (7): 1652-1665 (2019)Special Session : Machine Learning for Semiconductor Test and Reliability, , , , , , , , , and . 2021 IEEE 39th VLSI Test Symposium (VTS), Piscataway, IEEE, (2021)On the Reliability of FeFET On-Chip Memory, , , and . IEEE transactions on computers, 71 (4): 947-958 (2022)Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths, , , , , and . 2023 IEEE International Reliability Physics Symposium (IRPS), IEEE, (2023)Designing guardbands for instantaneous aging effects., , , , and . DAC, page 69:1-69:6. ACM, (2016)Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE., , and . IOLTS, page 143-146. IEEE, (2018)Connecting the physical and application level towards grasping aging effects., , , , , , and . IRPS, page 3. IEEE, (2015)Estimating and optimizing BTI aging effects: from physics to CAD., , and . ICCAD, page 125. ACM, (2018)Self-Heating Effects from Transistors to Gates, , and . 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), page 1-4. Piscataway, IEEE, (2021)Aging-aware voltage scaling., , , , and . DATE, page 576-581. IEEE, (2016)