%0 Conference Paper %1 amrouch2021special %A Amrouch, Hussam %A Chowdhury, Animesh Basak %A Jin, Wentian %A Karri, Ramesh %A Khorrami, Farshad %A Krishnamurthy, Prashanth %A Polian, Ilia %A Santen, Victor M. van %A Tan, Benjamin %A Tan, Sheldon X.-D. %B 2021 IEEE 39th VLSI Test Symposium (VTS) %C Piscataway %D 2021 %E Basio, Alberto %E Basu, Kanad %I IEEE %K %R 10.1109/VTS50974.2021.9441052 %T Special Session : Machine Learning for Semiconductor Test and Reliability %@ 978-1-6654-1949-9 and 978-1-6654-3005-0

@inproceedings{amrouch2021special, added-at = {2023-08-31T14:56:22.000+0200}, address = {Piscataway}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Comp Sci Dept, Stuttgart, Germany. Amrouch, Hussam; Polian, Ilia; van Santen, Victor M., Univ Stuttgart, Comp Sci Dept, Stuttgart, Germany. Chowdhury, Animesh Basak; Karri, Ramesh; Khorrami, Farshad; Krishnamurthy, Prashanth; Tan, Benjamin, NYU, Tandon Sch Engn, New York, NY USA. Jin, Wentian; Tan, Sheldon X-D, Univ Calif Riverside, Riverside, CA 92521 USA.}, author = {Amrouch, Hussam and Chowdhury, Animesh Basak and Jin, Wentian and Karri, Ramesh and Khorrami, Farshad and Krishnamurthy, Prashanth and Polian, Ilia and Santen, Victor M. van and Tan, Benjamin and Tan, Sheldon X.-D.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28217d34d282967a1b0cb4248f2cdb3cd/puma-wartung}, booktitle = {2021 IEEE 39th VLSI Test Symposium (VTS)}, doi = {10.1109/VTS50974.2021.9441052}, editor = {Basio, Alberto and Basu, Kanad}, eventdate = {2021-04-25/2021-04-28}, eventtitle = {2021 IEEE 39th VLSI Test Symposium (VTS)}, interhash = {e497b6971d00a4faedec1ec3f4c9ddf8}, intrahash = {8217d34d282967a1b0cb4248f2cdb3cd}, isbn = {{978-1-6654-1949-9} and {978-1-6654-3005-0}}, keywords = {}, language = {eng}, publisher = {IEEE}, timestamp = {2023-08-31T12:56:22.000+0200}, title = {Special Session : Machine Learning for Semiconductor Test and Reliability}, venue = {Online}, year = 2021 }