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Special Session : Machine Learning for Semiconductor Test and Reliability

H. Amrouch, A. Chowdhury, W. Jin, R. Karri, F. Khorrami, P. Krishnamurthy, I. Polian, V. Santen, B. Tan, and S. Tan. 2021 IEEE 39th VLSI Test Symposium (VTS), Piscataway, IEEE, (2021)
DOI: 10.1109/VTS50974.2021.9441052

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Dr. -Ing. Hussam Amrouch University of Stuttgart

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Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.A. Amouri, H. Amrouch, T. Ebi, J. Henkel, and M. Tahoori. FCCM, page 57-60. IEEE Computer Society, (2013)Towards interdependencies of aging mechanisms.H. Amrouch, V. van Santen, T. Ebi, V. Wenzel, and J. Henkel. ICCAD, page 478-485. IEEE, (2014)Lucid infrared thermography of thermally-constrained processors.H. Amrouch, and J. Henkel. ISLPED, page 347-352. IEEE, (2015)Stress balancing to mitigate NBTI effects in register files.H. Amrouch, T. Ebi, and J. Henkel. DSN, page 1-10. IEEE Computer Society, (2013)Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.V. van Santen, J. Martín-Martínez, H. Amrouch, M. Nafría, and J. Henkel. IEEE Trans. on Circuits and Systems, 65-I (1): 293-306 (2018)Dynamic resource management for heterogeneous many-cores.J. Henkel, J. Teich, S. Wildermann, and H. Amrouch. ICCAD, page 60. ACM, (2018)Emerging (un-)reliability based security threats and mitigations for embedded systems: special session.H. Amrouch, P. Krishnamurthy, N. Patel, J. Henkel, R. Karri, and F. Khorrami. CASES, page 17:1-17:10. ACM, (2017)On-Demand Mobile CPU Cooling With Thin-Film Thermoelectric ArrayH. Kattan, S. Chung, J. Henkel, and H. Amrouch. IEEE micro, 41 (4): 67-73 (2021)On the Reliability of In-Memory Computing : Impact of Temperature on Ferroelectric TCAMS. Thomann, C. Li, C. Zhuo, O. Prakash, X. Yin, X. Hu, and H. Amrouch. Proceedings 2021 IEEE 39th VLSI Test Symposium (VTS), Piscataway, IEEE, (2021)On the Effectiveness of Quantization and Pruning on the Performance of FPGAs-based NN Temperature EstimationV. Muvva, M. Rapp, J. Henkel, H. Amrouch, and M. Wolf. 2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD (MLCAD), Piscataway, IEEE, (2021)

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Disambiguation of "Amrouch, Hussam"

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Special Session : Machine Learning for Semiconductor Test and Reliability

Please choose a person to relate this publication to

Dr. -Ing. Hussam Amrouch University of Stuttgart

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Special Session : Machine Learning for Semiconductor Test and Reliability

Please choose a person to relate this publication to

Dr. -Ing. Hussam Amrouch University of Stuttgart

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Special Session : Machine Learning for Semiconductor Test and Reliability