N. Lylina, C. Wang, and H. Wunderlich. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1149-1152. Piscataway, IEEE, (2022)
A. Schöll, C. Braun, and H. Wunderlich. 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), page 21-26. Piscataway, IEEE, (2016)