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Resistive Open Defect Classification of Embedded Cells under Variations, and . 2021 IEEE 22nd Latin American Test Symposium (LATS), Piscataway, IEEE, (2021)On Extracting Reliability Information from Speed Binning, , , and . 2022 IEEE European Test Symposium (ETS), Piscataway, IEEE, (2022)Test Aspects of System Health State Monitoring, , , , and . 24th IEEE Latin American Test Symposium, Piscataway, NJ, IEEE, (2023)Identifying Resistive Open Defects in Embedded Cells under Variations, and . Journal of electronic testing, (2023)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 969-974. Piscataway, IEEE, (2022)Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning, , , and . 2022 IEEE International Test Conference (ITC), page 185-193. Piscataway, IEEE, (2022)Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection, , , , and . 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, (2023)Variation-Aware Defect Characterization at Cell Level, , and . 2020 IEEE European Test Symposium (ETS), page 1-6. IEEE, (2020)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)