%0 Journal Article %1 najafihaghi2023identifying %A Najafi-Haghi, Zahra Paria %A Wunderlich, Hans-Joachim %D 2023 %I Springer %J Journal of electronic testing %K %P 27-40 %R 10.1007/s10836-023-06044-z %T Identifying Resistive Open Defects in Embedded Cells under Variations %V 39

@article{najafihaghi2023identifying, added-at = {2023-08-03T09:15:21.000+0200}, author = {Najafi-Haghi, Zahra Paria and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20071e6a15c4cdfa6cb29d1ab82936496/unibiblio}, doi = {10.1007/s10836-023-06044-z}, interhash = {219cd1feaa5841163f7ca1bcff10aea7}, intrahash = {0071e6a15c4cdfa6cb29d1ab82936496}, issn = {1573-0727}, journal = {Journal of electronic testing}, keywords = {}, language = {eng}, pages = {27-40}, publisher = {Springer}, timestamp = {2023-08-03T09:15:21.000+0200}, title = {Identifying Resistive Open Defects in Embedded Cells under Variations}, volume = 39, year = 2023 }