%0 Conference Paper %1 santen2021selfheating %A Santen, Victor M. van %A Schillinger, Linda %A Amrouch, Hussam %B 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) %C Piscataway %D 2021 %I IEEE %K %P 1-4 %R 10.1109/VLSI-DAT52063.2021.9427356 %T Self-Heating Effects from Transistors to Gates %@ 978-1-6654-1915-4 and 978-1-6654-3028-9

@inproceedings{santen2021selfheating, added-at = {2023-08-31T14:59:30.000+0200}, address = {Piscataway}, affiliation = {van Santen, VM (Corresponding Author), Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany. van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Dept Comp Sci, Stuttgart, Germany.}, author = {Santen, Victor M. van and Schillinger, Linda and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8e05c23c91754168825d5dd5f882b12/puma-wartung}, booktitle = {2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)}, doi = {10.1109/VLSI-DAT52063.2021.9427356}, eventdate = {2021-04-19/2021-04-21}, eventtitle = {2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)}, interhash = {603ef38b7a1c175105924a2fe53b597e}, intrahash = {b8e05c23c91754168825d5dd5f882b12}, isbn = {{978-1-6654-1915-4} and {978-1-6654-3028-9}}, keywords = {}, language = {eng}, pages = {1-4}, publisher = {IEEE}, timestamp = {2023-08-31T12:59:30.000+0200}, title = {Self-Heating Effects from Transistors to Gates}, unique-id = {WOS:000675593900045}, venue = {{Hsinchu, Taiwan} and {Online}}, year = 2021 }