%0 Conference Paper %1 santen2023characterizing %A Santen, Victor M. van %A Gata-Romero, Jose M. %A Nunez, Juan %A Castro-Lopez, Rafael %A Roca, Elisenda %A Amrouch, Hussam %B 2023 IEEE International Reliability Physics Symposium (IRPS) %D 2023 %I IEEE %K %R 10.1109/IRPS48203.2023.10117751 %T Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths %@ 978-1-6654-5672-2 and 978-1-6654-5673-9

@inproceedings{santen2023characterizing, added-at = {2023-11-30T17:21:52.000+0100}, affiliation = {van Santen, VM (Corresponding Author), Univ Stuttgart, Semicond Test \& Reliabil STAR, Stuttgart, Germany. van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Semicond Test \& Reliabil STAR, Stuttgart, Germany. Gata-Romero, Jose M.; Nunez, Juan; Castro-Lopez, Rafael; Roca, Elisenda, Univ Seville, IMSE CNM, CSIC, Seville, Spain.}, author = {Santen, Victor M. van and Gata-Romero, Jose M. and Nunez, Juan and Castro-Lopez, Rafael and Roca, Elisenda and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27a483588aeef385f343624849a2c40eb/unibiblio}, booktitle = {2023 IEEE International Reliability Physics Symposium (IRPS)}, doi = {10.1109/IRPS48203.2023.10117751}, eventdate = {2023-03-26/2023-03-30}, eventtitle = {2023 IEEE International Reliability Physics Symposium (IRPS)}, interhash = {7a1034cba7f7d812e7f138f79c574c4e}, intrahash = {7a483588aeef385f343624849a2c40eb}, isbn = {{978-1-6654-5672-2} and {978-1-6654-5673-9}}, keywords = {}, language = {eng}, publisher = {IEEE}, research-areas = {Engineering; Physics}, timestamp = {2023-11-30T16:21:52.000+0100}, title = {Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths}, unique-id = {WOS:001007431500042}, venue = {Monterey, USA}, year = 2023 }