2023 IEEE International Reliability Physics Symposium (IRPS)
year
2023
publisher
IEEE
venue
Monterey, USA
isbn
978-1-6654-5672-2 and 978-1-6654-5673-9
research-areas
Engineering; Physics
language
eng
eventdate
2023-03-26/2023-03-30
eventtitle
2023 IEEE International Reliability Physics Symposium (IRPS)
affiliation
van Santen, VM (Corresponding Author), Univ Stuttgart, Semicond Test & Reliabil STAR, Stuttgart, Germany.
van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Semicond Test & Reliabil STAR, Stuttgart, Germany.
Gata-Romero, Jose M.; Nunez, Juan; Castro-Lopez, Rafael; Roca, Elisenda, Univ Seville, IMSE CNM, CSIC, Seville, Spain.
%0 Conference Paper
%1 santen2023characterizing
%A Santen, Victor M. van
%A Gata-Romero, Jose M.
%A Nunez, Juan
%A Castro-Lopez, Rafael
%A Roca, Elisenda
%A Amrouch, Hussam
%B 2023 IEEE International Reliability Physics Symposium (IRPS)
%D 2023
%I IEEE
%K ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos
%R 10.1109/IRPS48203.2023.10117751
%T Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths
%@ 978-1-6654-5672-2 and 978-1-6654-5673-9
@inproceedings{santen2023characterizing,
added-at = {2023-11-30T17:21:50.000+0100},
affiliation = {van Santen, VM (Corresponding Author), Univ Stuttgart, Semicond Test \& Reliabil STAR, Stuttgart, Germany.
van Santen, Victor M.; Amrouch, Hussam, Univ Stuttgart, Semicond Test \& Reliabil STAR, Stuttgart, Germany.
Gata-Romero, Jose M.; Nunez, Juan; Castro-Lopez, Rafael; Roca, Elisenda, Univ Seville, IMSE CNM, CSIC, Seville, Spain.},
author = {Santen, Victor M. van and Gata-Romero, Jose M. and Nunez, Juan and Castro-Lopez, Rafael and Roca, Elisenda and Amrouch, Hussam},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27a483588aeef385f343624849a2c40eb/unibiblio},
booktitle = {2023 IEEE International Reliability Physics Symposium (IRPS)},
doi = {10.1109/IRPS48203.2023.10117751},
eventdate = {2023-03-26/2023-03-30},
eventtitle = {2023 IEEE International Reliability Physics Symposium (IRPS)},
interhash = {7a1034cba7f7d812e7f138f79c574c4e},
intrahash = {7a483588aeef385f343624849a2c40eb},
isbn = {{978-1-6654-5672-2} and {978-1-6654-5673-9}},
keywords = {ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos},
language = {eng},
publisher = {IEEE},
research-areas = {Engineering; Physics},
timestamp = {2023-11-30T17:21:50.000+0100},
title = {Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths},
unique-id = {WOS:001007431500042},
venue = {Monterey, USA},
year = 2023
}