A. Schöll, C. Braun, M. Kochte, and H. Wunderlich. Proceedings of the 21st IEEE International On-Line Testing Symposium, page 95-100. Piscataway, NJ, IEEE, (2015)
A. Schöll, C. Braun, M. Kochte, and H. Wunderlich. 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015), page 60-65. Piscataway, NJ, IEEE Computer Society, (2015)
H. Wunderlich, and M. Radetzki. NOCS : proceedings : 2015 ninth IEEE/ACM International Symposium on Networks-on-Chip, page 5:1-5:8. New York, ACM, (2015)
H. Zhang, M. Kochte, E. Schneider, L. Bauer, H. Wunderlich, and J. Henkel. Proceedings of the 34th IEEE/ACM International Conference on Computer-Aided Design (ICCAD'15), Austin, Texas, USA, 2-6 November 2015, page 38-45. Piscataway, NJ, IEEE, (2015)
A. Schöll, C. Braun, and H. Wunderlich. 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), page 21-26. Piscataway, IEEE, (2016)
N. Lylina, C. Wang, and H. Wunderlich. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1149-1152. Piscataway, IEEE, (2022)
A. Schöll, C. Braun, M. Kochte, and H. Wunderlich. 2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), page 251-262. Piscataway, IEEE, (2016)
H. Wunderlich, C. Braun, and A. Schöll. 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), page 133-136. Piscataway, IEEE, (2016)
A. Schöll, C. Braun, and H. Wunderlich. 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), page 237-239. Piscataway, IEEE, (2017)