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Intermittent and transient fault diagnosis on sparse code signatures

M. Kochte, A. Dalirsani, A. Bernabei, M. Omaña, C. Metra, and H. Wunderlich. 2015 IEEE 24th Asian Test Symposium (ATS 2015), page 157-162. Piscataway, NJ, IEEE Computer Society, (2015)
DOI: 10.1109/ATS.2015.34

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Martin Markert University of Stuttgart

Einfluss von RC-Gesteinskörnung auf das Druckkriechen eines hochfesten BetonsM. Markert, and H. Garrecht. ce/papers, 6 (6): 984-990 (2023)

Martin Baumann

Martin Schwartz University of Stuttgart

Martin Alvarez University of Stuttgart

Univ. -Prof. Martin Ostermann University of Stuttgart

Other publications of authors with the same name

Multiple Transient Faults in Logic: An Issue for Next Generation ICs.D. Rossi, M. Omaña, F. Toma, and C. Metra. DFT, page 352-360. IEEE Computer Society, (2005)Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST.M. Omaña, D. Rossi, E. Beniamino, C. Metra, C. Tirumurti, and R. Galivanche. IEEE Trans. Computers, 65 (8): 2484-2494 (2016)Fault-Tolerant Inverters for Reliable Photovoltaic Systems.M. Omaña, A. Fiore, M. Mongitore, and C. Metra. IEEE Trans. VLSI Syst., 27 (1): 20-28 (2019)Novel compensation scheme for local clocks of high performance microprocessors.C. Metra, M. Omaña, T. Mak, and S. Tam. ITC, page 1-9. IEEE Computer Society, (2007)Novel low-cost aging sensor.M. Omaña, D. Rossi, N. Bosio, and C. Metra. Conf. Computing Frontiers, page 93-94. ACM, (2010)Low-Cost On-Chip Clock Jitter Measurement Scheme.M. Omaña, D. Rossi, D. Giaffreda, C. Metra, T. Mak, A. Rahman, and S. Tam. IEEE Trans. VLSI Syst., 23 (3): 435-443 (2015)Accurate Linear Model for SET Critical Charge Estimation.D. Rossi, J. Cazeaux, M. Omaña, C. Metra, and A. Chatterjee. IEEE Trans. VLSI Syst., 17 (8): 1161-1166 (2009)New Design for Testability Approach for Clock Fault Testing.C. Metra, M. Omaña, T. Mak, and S. Tam. IEEE Trans. Computers, 61 (4): 448-457 (2012)Faults affecting the control blocks of PV arrays and techniques for their concurrent detection.M. Omaña, D. Rossi, G. Collepalumbo, C. Metra, and F. Lombardi. DFT, page 199-204. IEEE Computer Society, (2012)The Other Side of the Timing Equation: a Result of Clock Faults.C. Metra, M. Omaña, D. Rossi, J. Cazeaux, and T. Mak. DFT, page 169-177. IEEE Computer Society, (2005)