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Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems

C. Wang, N. Lylina, A. Atteya, T. Hsieh, and H. Wunderlich. 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), Piscataway, IEEE, (2021)
DOI: 10.1109/IOLTS52814.2021.9486710

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Wei Yu University of Stuttgart

Vinh Tong University of Stuttgart

Yiwen Yuan University of Stuttgart

Xingyao Yu University of Stuttgart

Yu Li University of Stuttgart

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Accumulator-based output selection for test response compaction.W. Lien, K. Lee, T. Hsieh, S. Chien, and K. Chakrabarty. ISCAS, page 2313-2316. IEEE, (2012)On-Chip SOC Test Platform Design Based on IEEE 1500 Standard.K. Lee, T. Hsieh, C. Chang, Y. Hong, and W. Huang. IEEE Trans. VLSI Syst., 18 (7): 1134-1139 (2010)An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement.T. Hsieh, K. Lee, and M. Breuer. IEEE Trans. on CAD of Integrated Circuits and Systems, 30 (6): 930-934 (2011)An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters.W. Lien, K. Lee, T. Hsieh, and W. Ang. IEEE Trans. on CAD of Integrated Circuits and Systems, 32 (8): 1254-1264 (2013)Output selection for test response compaction based on multiple counters.W. Lien, K. Lee, K. Chakrabarty, and T. Hsieh. VLSI-DAT, page 1-4. IEEE, (2014)A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume.W. Lien, K. Lee, and T. Hsieh. Asian Test Symposium, page 278-283. IEEE Computer Society, (2012)On efficient error-tolerability evaluation and maximization for image processing applications.T. Hsieh, K. Li, and Y. Peng. VLSI-DAT, page 1-4. IEEE, (2014)Output-bit selection with X-avoidance using multiple counters for test-response compaction.W. Lien, K. Lee, K. Chakrabarty, and T. Hsieh. ETS, page 1-6. IEEE, (2014)On Automatic Generation of Training Images for Machine Learning in Automotive Applications.T. Hsieh, Y. Lin, and H. Shen. AICAS, page 225-228. IEEE, (2019)A Delay-Aware Implementation Scheme for Cost-Effective Implication-Based Concurrent Error Detection.T. Hsieh, K. Lin, and H. Lin. ITC-Asia, page 145-150. IEEE, (2019)