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Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems

C. Wang, N. Lylina, A. Atteya, T. Hsieh, and H. Wunderlich. 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), Piscataway, IEEE, (2021)
DOI: 10.1109/IOLTS52814.2021.9486710

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Chih-Hao Wang University of Stuttgart

Xiang Hao University of Stuttgart

Hao Lu University of Stuttgart

Zhe Wang University of Stuttgart

Dr. Dongren Wang University of Stuttgart

Other publications of authors with the same name

The applications of integrated microfluidic chips on automatic diagnosis systems.C. Wang, and G. Lee. ROBIO, page 251-256. IEEE, (2005)Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection.C. Wang, C. Ho, and T. Hsieh. ITC-Asia, page 127-132. IEEE, (2018)A Complete Design-for-Test Scheme for Reconfigurable Scan NetworksN. Lylina, C. Wang, and H. Wunderlich. Journal of electronic testing, 38 (6): 603–621 (2022)A Green Time-Bounded Routing on Solar-Based Vehicular Ad-Hoc Networks.Y. Chen, Y. Lin, and C. Wang. Intelligent Automation & Soft Computing, 21 (4): 455-472 (2015)Transparent IP Mobility Management.H. Liu, C. Wang, and C. Tseng. FGCN (1), page 374-377. IEEE Computer Society, (2007)RSL19BD at DBDC4: Ensemble of Decision Tree-based and LSTM-based Models.C. Wang, S. Kato, and T. Sakai. CoRR, (2019)A land-use and capital-investment allocation optimization model to develop a fair community opportunity framework for Columbus, Ohio.C. Wang. Computers, Environment and Urban Systems, (2019)Testability-Enhancing Resynthesis of Reconfigurable Scan NetworksN. Lylina, C. Wang, and H. Wunderlich. 2021 IEEE International Test Conference (ITC), page 20-29. Piscataway, IEEE, (2021)Robust Reconfigurable Scan NetworksN. Lylina, C. Wang, and H. Wunderlich. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1149-1152. Piscataway, IEEE, (2022)SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan NetworksN. Lylina, C. Wang, and H. Wunderlich. IEEE transactions on computer-aided design of integrated circuits and systems, 41 (12): 5644-5656 (2022)