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Disambiguation of "Kochte, Michael A."

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Efficient observation point selection for aging monitoring

, , and . Proceedings of the 21st IEEE International On-Line Testing Symposium, page 176-181. Piscataway, NJ, IEEE, (2015)
DOI: 10.1109/IOLTS.2015.7229855

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A. Laukemann

A. Laukemann

A. Laukemann

A. Vo{\ss}

A. Afkari

 

Other publications of authors with the same name

OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware"., , , , , , and . AHS, page 38-45. IEEE, (2012)Test exploration and validation using transaction level models., , , , , , , and . DATE, page 1250-1253. IEEE, (2009)Scan pattern retargeting and merging with reduced access time., , and . ETS, page 1-7. IEEE Computer Society, (2013)FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects., , , , , and . ITC, page 1-8. IEEE Computer Society, (2014)Modeling, verification and pattern generation for reconfigurable scan networks., , and . ITC, page 1-9. IEEE Computer Society, (2012)Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)An on-chip self-test architecture with test patterns recorded in scan chains., , and . ITC, page 1-10. IEEE, (2016)Efficient fault simulation on many-core processors., , , and . DAC, page 380-385. ACM, (2010)Online Prevention of Security Violations in Reconfigurable Scan Networks, , , , , and . 2018 23rd IEEE European Test Symposium (ETS), IEEE, (2018)Structure-Oriented Test of Reconfigurable Scan Networks, , and . 2017 IEEE 26th Asian Test Symposium (ATS), page 127-132. Piscataway, IEEE, (2017)