Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Detecting and Resolving Security Violations in Reconfigurable Scan Networks

P. Raiola, M. Kochte, A. Atteya, L. Rodríguez Gómez, H. Wunderlich, B. Becker, and M. Sauer. 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), page 91-96. Piscataway, IEEE, (2018)
DOI: 10.1109/IOLTS.2018.8474188

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Franziska Becker University of Stuttgart

Bernd Bertsche

Dr. -Ing. Dina Becker University of Stuttgart

Univ. -Prof. Dr. -Ing. Steffen Becker University of Stuttgart

Dr. rer. nat. Bernd Schulz University of Stuttgart

Other publications of authors with the same name

Fault diagnosis aware ATE assisted test response compaction.J. Howard, S. Reddy, I. Pomeranz, and B. Becker. ASP-DAC, page 812-817. IEEE, (2011)Multithreaded SAT Solving.M. Lewis, T. Schubert, and B. Becker. ASP-DAC, page 926-931. IEEE Computer Society, (2007)Look-up Table FPGA Synthesis from Minimized Multi-Valued Pseudo Kronecker Expressions.P. Lindgren, R. Drechsler, and B. Becker. ISMVL, page 95-101. IEEE Computer Society, (1998)Improving diagnosis resolution of a fault detection test set.A. Riefert, M. Sauer, S. Reddy, and B. Becker. VTS, page 1-6. IEEE Computer Society, (2015)ATPG-based grading of strong fault-secureness.M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker. IOLTS, page 269-274. IEEE Computer Society, (2009)Stop & Go BIST.I. Polian, and B. Becker. IOLTW, page 147-151. IEEE Computer Society, (2002)Grouping heuristics for word-level decision diagrams.R. Drechsler, M. Herbstritt, and B. Becker. ISCAS (1), page 411-414. IEEE, (1999)X-masking during logic BIST and its impact on defect coverage.Y. Tang, H. Wunderlich, P. Engelke, I. Polian, B. Becker, J. Schlöffel, F. Hapke, and M. Wittke. IEEE Trans. VLSI Syst., 14 (2): 193-202 (2006)Systemic Frequency Biases in Ring Oscillator PUFs on FPGAs.L. Feiten, J. Oesterle, T. Martin, M. Sauer, and B. Becker. IEEE Trans. Multi-Scale Computing Systems, 2 (3): 174-185 (2016)Minimal counterexamples for linear-time probabilistic verification.R. Wimmer, N. Jansen, E. Ábrahám, J. Katoen, and B. Becker. Theor. Comput. Sci., (2014)