%0 Conference Paper %1 wunderlich2015multilayer %A Wunderlich, Hans-Joachim %A Radetzki, Martin %B NOCS : proceedings : 2015 ninth IEEE/ACM International Symposium on Networks-on-Chip %C New York %D 2015 %E Ivanov, André %E Marculescu, Diana %E Pande, Partha Pratim %E Flich, José %E Pattabiraman, Karthik %I ACM %K %P 5:1-5:8 %R 10.1145/2786572.2788708 %T Multi-layer test and diagnosis for dependable NoCs %@ 978-1-4503-3396-2

@inproceedings{wunderlich2015multilayer, added-at = {2023-08-31T16:19:48.000+0200}, address = {New York}, author = {Wunderlich, Hans-Joachim and Radetzki, Martin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22a3f67a370514c6954d696b9b013b2b7/puma-wartung}, booktitle = {NOCS : proceedings : 2015 ninth IEEE/ACM International Symposium on Networks-on-Chip}, doi = {10.1145/2786572.2788708}, editor = {Ivanov, André and Marculescu, Diana and Pande, Partha Pratim and Flich, José and Pattabiraman, Karthik}, eventdate = {2015-09-28/2015-09-30}, eventtitle = {NOCS - 2015 ninth IEEE/ACM International Symposium on Networks-on-Chip}, interhash = {6cb08de14dcf4917f6166a0ca4926f62}, intrahash = {2a3f67a370514c6954d696b9b013b2b7}, isbn = {978-1-4503-3396-2}, keywords = {}, language = {eng}, pages = {5:1-5:8}, publisher = {ACM}, timestamp = {2023-08-31T14:19:48.000+0200}, title = {Multi-layer test and diagnosis for dependable NoCs}, venue = {Vancouver, British Columbia, Canada}, year = 2015 }