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Pattern analysis for defect classification. Präsentation, (2015)Detecting and Resolving Security Violations in Reconfigurable Scan Networks, , , , , , and . 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), page 91-96. Piscataway, IEEE, (2018)Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures., , , , , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Neural-network based defect classifier. Präsentation, (2015)Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures., , , , , , , , and . DAC, page 96:1-96:9. ACM, (2014)Specification and verification of security in reconfigurable scan networks, , , , , and . 2017 22nd IEEE European Test Symposium (ETS), Piscataway, IEEE, (2017)Machine learning support for logic diagnosis. Universität Stuttgart, Stuttgart, Dissertation, (2017)A Neural-Network-Based Fault Classifier, and . 2016 IEEE 25th Asian Test Symposium (ATS), page 144-149. Piscataway, IEEE, (2016)Adaptive Bayesian Diagnosis of Intermittent Faults., , , , and . J. Electronic Testing, 30 (5): 527-540 (2014)Preventing Omission of Key Evidence Fallacy in Process-Based Argumentations., , and . QUATIC, page 65-73. IEEE Computer Society, (2018)