PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Mitra, Subhasish"

Author of the publication

copydeleteadd this publication to your clipboard
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights.

, , , , , , , , , , , , , , , and . ICCD, page 593-596. IEEE Computer Society, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ph. D. Subhasish Das University of Stuttgart

 

Other publications of authors with the same name

A Design Diversity Metric and Analysis of Redundant Systems., , and . IEEE Trans. Computers, 51 (5): 498-510 (2002)Optimized reseeding by seed ordering and encoding., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 24 (2): 264-270 (2005)Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection., , , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (10): 1573-1590 (2014)Fast Run-Time Fault Location in Dependable FPGA-Based Applications., , and . DFT, page 206-214. IEEE Computer Society, (2001)Testing Digital Circuits with Constraints., , and . DFT, page 195-206. IEEE Computer Society, (2002)Recent Advances and New Avenues in Hardware-Level Reliability Support., , , and . IEEE Micro, 25 (6): 18-29 (2005)Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)Diversity Techniques for Concurrent Error Detection., and . ISQED, page 249-250. IEEE Computer Society, (2001)A new era of computing: Are you "ready now" to build a smarter and secured enterprise?, , , , and . ISQED, page 1. IEEE, (2014)Probabilistic analysis of Gallager B faulty decoder., , , , and . ICC, page 7019-7023. IEEE, (2012)