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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

, , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Supply Switching With Ground Collapse: Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits., , , and . IEEE Trans. VLSI Syst., 15 (7): 758-766 (2007)Semicustom Design Methodology of Power Gated Circuits for Low Leakage Applications., and . IEEE Trans. on Circuits and Systems, 54-II (6): 512-516 (2007)Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits., , , and . ASP-DAC, page 654-659. IEEE Computer Society, (2007)Analysis of power consumption in VLSI global interconnects., and . ISCAS (5), page 4713-4716. IEEE, (2005)Physical design methodology of power gating circuits for standard-cell-based design., , , and . DAC, page 109-112. ACM, (2006)Power-aware slack distribution for hierarchical VLSI design., and . ISCAS (4), page 4150-4153. IEEE, (2005)Analysis and optimization of gate leakage current of power gating circuits., and . ASP-DAC, page 565-569. IEEE, (2006)Coarse-grained Structural Placement for a Synthesized Parallel Multiplier., , , and . ISPD, page 17-24. ACM, (2015)Early-life-failure detection using SAT-based ATPG., , , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2013)Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS., , , , , and . IEEE Trans. VLSI Syst., 18 (3): 505-509 (2010)