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Disambiguation of "Sauer, Matthias"

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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

, , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Univ. -Prof. Dr. -Ing. Alexander Sauer University of Stuttgart

Alexander Sauer

Colin Sauerzapf University of Stuttgart

Ralf Sauerwald University of Stuttgart

Dr. Britta Sauereisen University of Stuttgart

 

Other publications of authors with the same name

Identification of critical variables using an FPGA-based fault injection framework., , , , and . VTS, page 1-6. IEEE Computer Society, (2013)Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths., , , , and . DATE, page 448-453. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)Search Space Reduction for Low-Power Test Generation., , , , and . Asian Test Symposium, page 171-176. IEEE Computer Society, (2013)On Metrics to Quantify the Inter-Device Uniqueness of PUFs., , and . IACR Cryptology ePrint Archive, (2016)Accurate Computation of Sensitizable Paths Using Answer Set Programming., , , , , and . LPNMR, volume 8148 of Lecture Notes in Computer Science, page 92-101. Springer, (2013)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. (2021)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. Piscataway, IEEE, (2021)On secure data flow in reconfigurable scan networks, , , , , , , and . 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1016-1021. IEEE, (2019)Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns, , , , , and . 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC), page 749-754. Piscataway, IEEE, (2016)