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Disambiguation of "Elhamawy, Nourhan"

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Security, Reliability and Test Aspects of the RISC-V Ecosystem

, , , , , , , , , , , , , , , and . 2021 IEEE European Test Symposium (ETS), page 1-10. (2021)
DOI: 10.1109/ETS50041.2021.9465449

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Nourhan Elhamawy University of Stuttgart

 

Other publications of authors with the same name

Exploring the Mysteries of System-Level Test, , , , , , , , , and . 2020 IEEE 29th Asian Test Symposium (ATS), page 1-6. IEEE, (2020)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. Piscataway, IEEE, (2021)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. (2021)A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors, , , , , , , , , and 10 other author(s). 2023 IEEE European Test Symposium (ETS), IEEE, (2023)Exploring the Mysteries of System-Level Test, , , , , , , , , and . CoRR, (2021)An Open-Source Area-Optimized ECEG Cryptosystem in Hardware, , and . 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), page 120-125. IEEE, (2020)A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors, , , , , , , , , and 10 other author(s). 2023 IEEE European Test Symposium (ETS), IEEE, (May 2023)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 969-974. Piscataway, IEEE, (2022)