%0 Conference Paper %1 abella2021security %A Abella, Jaume %A Alcaide, Sergi %A Anders, Jens %A Bas, Francisco %A Becker, Steffen %A De Mulder, Elke %A Elhamawy, Nourhan %A Gürkaynak, Frank K. %A Handschuh, Helena %A Hernandez, Carles %A Hutter, Mike %A Kosmidis, Leonidas %A Polian, Ilia %A Sauer, Matthias %A Wagner, Stefan %A Regazzoni, Francesco %B 2021 IEEE European Test Symposium (ETS) %C Piscataway %D 2021 %E Taouil, Mottaqiallah %I IEEE %K %P 1-10 %R 10.1109/ETS50041.2021.9465449 %T Security, Reliability and Test Aspects of the RISC-V Ecosystem %@ 978-1-6654-1849-2 and 978-1-6654-1848-5 and 978-1-6654-4819-2

@inproceedings{abella2021security, added-at = {2023-08-31T14:59:54.000+0200}, address = {Piscataway}, affiliation = {Abella, J (Corresponding Author), Barcelona Supercomp Ctr BSC, Barcelona, Spain. Abella, Jaume; Alcaide, Sergi; Bas, Francisco; Kosmidis, Leonidas, Barcelona Supercomp Ctr BSC, Barcelona, Spain. Anders, Jens; Becker, Steffen; Elhamawy, Nourhan; Polian, Ilia; Wagner, Stefan, Univ Stuttgart, Stuttgart, Germany. De Mulder, Elke; Handschuh, Helena; Hutter, Mike, Rambus, Sunnyvale, CA USA. Gurkaynak, Frank K., Swiss Fed Inst Technol, Zurich, Switzerland. Hernandez, Carles, Univ Politecn Valencia UPV, Valencia, Spain. Sauer, Matthias, Advantest Europe, Tokyo, Japan. Regazzoni, Francesco, Univ Amsterdam, Amsterdam, Netherlands. Regazzoni, Francesco, Univ Svizzera Italiana, Lugano, Switzerland.}, author = {Abella, Jaume and Alcaide, Sergi and Anders, Jens and Bas, Francisco and Becker, Steffen and De Mulder, Elke and Elhamawy, Nourhan and Gürkaynak, Frank K. and Handschuh, Helena and Hernandez, Carles and Hutter, Mike and Kosmidis, Leonidas and Polian, Ilia and Sauer, Matthias and Wagner, Stefan and Regazzoni, Francesco}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/263f19621e78b0799d662f3b73061b353/puma-wartung}, booktitle = {2021 IEEE European Test Symposium (ETS)}, doi = {10.1109/ETS50041.2021.9465449}, editor = {Taouil, Mottaqiallah}, eventdate = {2021-05-24/2021-05-28}, eventtitle = {2021 IEEE European Test Symposium (ETS)}, interhash = {936beac6cb8a682dc3c2c950d61bcf28}, intrahash = {63f19621e78b0799d662f3b73061b353}, isbn = {{978-1-6654-1849-2} and {978-1-6654-1848-5} and {978-1-6654-4819-2}}, keywords = {}, language = {eng}, pages = {1-10}, publisher = {IEEE}, timestamp = {2023-08-31T12:59:54.000+0200}, title = {Security, Reliability and Test Aspects of the RISC-V Ecosystem}, unique-id = {WOS:000693413600031}, venue = {Online}, year = 2021 }