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Disambiguation of "Kajihara, Seiji"

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Search Space Reduction for Low-Power Test Generation.

, , , , and . Asian Test Symposium, page 171-176. IEEE Computer Society, (2013)

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Other publications of authors with the same name

Stuck-open faults test generation for cmos combinational circuits., , and . Systems and Computers in Japan, 22 (9): 33-42 (1991)Retiming for Sequential Circuits with a Specified Initial State and Its Application to Testability Enhancement., , and . IEICE Transactions, 78-D (7): 861-867 (1995)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits., , , , and . IEICE Transactions, 91-D (3): 667-674 (2008)A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths., , , and . VLSI Design, page 82-87. IEEE Computer Society, (1997)On Test Data Volume Reduction for Multiple Scan Chain Designs., , , and . VTS, page 103-110. IEEE Computer Society, (2002)Enhanced untestable path analysis using edge graphs., , , and . Asian Test Symposium, page 139-144. IEEE Computer Society, (2000)An On-Chip Digital Environment Monitor for Field Test., , , and . ATS, page 254-257. IEEE Computer Society, (2014)Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing., , , , , , and . J. Electronic Testing, 24 (4): 379-391 (2008)CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing., , , , , , , and . Asian Test Symposium, page 99-104. IEEE Computer Society, (2009)Synthesis for Testability by Sequential Redundancy Removal Using Retiming., , and . FTCS, page 33-40. IEEE Computer Society, (1995)