PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Kinoshita, Kozo"

Author of the publication

copydeleteadd this publication to your clipboard
Stuck-open faults test generation for cmos combinational circuits.

, , and . Systems and Computers in Japan, 22 (9): 33-42 (1991)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Kinoshita, Kozo
add a person with the name Kinoshita, Kozo
 

Other publications of authors with the same name

Low-capture-power test generation for scan-based at-speed testing., , , , , , and . ITC, page 10. IEEE Computer Society, (2005)Design of High-Level Test Language for Digital LSI., , and . ITC, page 508-513. IEEE Computer Society, (1983)Removal of Redundancy in Logic Circuits under Classification of Undetectable Faults., , and . FTCS, page 263-270. IEEE Computer Society, (1992)Cascade Realization of 3-Input 3-Output Conservative Logic Circuits., and . IEEE Trans. Computers, 27 (3): 214-221 (1978)Realization of Minimum Circuits with Two-Input Conservative Logic Elements., and . IEEE Trans. Computers, 27 (8): 749-752 (1978)On Test Generation with A Limited Number of Tests., , and . Great Lakes Symposium on VLSI, page 12-15. IEEE Computer Society, (1999)An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits., , and . Asian Test Symposium, page 22-. IEEE Computer Society, (1997)Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique., , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (1996)Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits., , and . Asian Test Symposium, page 121-126. IEEE Computer Society, (1999)IDDQ Current Dependency on Test Vectors and Bridging Resistance., , and . Asian Test Symposium, page 158-163. IEEE Computer Society, (1999)