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Disambiguation of "Wen, Xiaoqing"

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Search Space Reduction for Low-Power Test Generation.

, , , , and . Asian Test Symposium, page 171-176. IEEE Computer Society, (2013)

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Dr. -Ing. Christoph Wenzel University of Stuttgart

Dr. rer. nat. Tim Wendlandt University of Stuttgart

Ingeborg Wenger University of Stuttgart

Florian Wenz University of Stuttgart

Marco Wende University of Stuttgart

 

Other publications of authors with the same name

Fault Diagnosis of Physical Defects Using Unknown Behavior Model., , , and . J. Comput. Sci. Technol., 20 (2): 187-194 (2005)Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing., , , , , , and . J. Electronic Testing, 24 (4): 379-391 (2008)Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , , , and 2 other author(s). IEEE Trans. on CAD of Integrated Circuits and Systems, 30 (3): 455-463 (2011)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. VLSI Syst., 24 (1): 38-49 (2016)A Testable Design of Logic Circuits under Highly Observable Condition., and . IEEE Trans. Computers, 41 (5): 654-659 (1992)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits., , , , and . IEICE Transactions, 91-D (3): 667-674 (2008)Testing of k-FR Circuits under Highly Observable Condition., , and . IEICE Transactions, 78-D (7): 830-838 (1995)VLSI testing and test power.. IGCC, page 1-6. IEEE Computer Society, (2011)Fault Diagnosis for Physical Defects of Unknown Behaviors., , , and . Asian Test Symposium, page 236-241. IEEE Computer Society, (2003)Session Summary III: Power-Aware Testing: Present and Future., and . Asian Test Symposium, page 220. IEEE Computer Society, (2012)