%0 Conference Paper %1 conf/green/Wen11 %A Wen, Xiaoqing %B IGCC %D 2011 %I IEEE Computer Society %K dblp %P 1-6 %T VLSI testing and test power. %U http://dblp.uni-trier.de/db/conf/green/green2011.html#Wen11 %@ 978-1-4577-1220-3

@inproceedings{conf/green/Wen11, added-at = {2015-06-16T00:00:00.000+0200}, author = {Wen, Xiaoqing}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2578d3a21d141df9126a929935bcb40f7/dblp}, booktitle = {IGCC}, crossref = {conf/green/2011}, ee = {http://doi.ieeecomputersociety.org/10.1109/IGCC.2011.6008607}, interhash = {68b3b4b7b614693972ea79674fc2102e}, intrahash = {578d3a21d141df9126a929935bcb40f7}, isbn = {978-1-4577-1220-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:53:51.000+0100}, title = {VLSI testing and test power.}, url = {http://dblp.uni-trier.de/db/conf/green/green2011.html#Wen11}, year = 2011 }