%0 Journal Article %1 journals/tc/XiaoqingK92 %A Wen, Xiaoqing %A Kinoshita, Kozo %D 1992 %J IEEE Trans. Computers %K dblp %N 5 %P 654-659 %T A Testable Design of Logic Circuits under Highly Observable Condition. %U http://dblp.uni-trier.de/db/journals/tc/tc41.html#XiaoqingK92 %V 41

@article{journals/tc/XiaoqingK92, added-at = {2015-12-22T00:00:00.000+0100}, author = {Wen, Xiaoqing and Kinoshita, Kozo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ed5a55ab1f47a1743dc454892bf6cf5f/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/12.142692}, interhash = {61daf261ce93fdd1941279d710c60151}, intrahash = {ed5a55ab1f47a1743dc454892bf6cf5f}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 5, pages = {654-659}, timestamp = {2016-02-02T02:37:49.000+0100}, title = {A Testable Design of Logic Circuits under Highly Observable Condition.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc41.html#XiaoqingK92}, volume = 41, year = 1992 }