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Disambiguation of "Kinoshita, Kozo"

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Fault Diagnosis for Physical Defects of Unknown Behaviors.

, , , and . Asian Test Symposium, page 236-241. IEEE Computer Society, (2003)

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Other publications of authors with the same name

Resynthesis for sequential circuits designed with a specified initial state., , and . VTS, page 152-157. IEEE Computer Society, (1995)SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines., , , and . IEICE Transactions, 96-A (12): 2561-2567 (2013)On Test Generation with A Limited Number of Tests., , and . Great Lakes Symposium on VLSI, page 12-15. IEEE Computer Society, (1999)Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits., , and . Asian Test Symposium, page 121-126. IEEE Computer Society, (1999)IDDQ Current Dependency on Test Vectors and Bridging Resistance., , and . Asian Test Symposium, page 158-163. IEEE Computer Society, (1999)A BIST Circuit for IDDQ Tests., , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)A high-speed IDDQ sensor implementation., , , and . Asian Test Symposium, page 356-361. IEEE Computer Society, (2000)Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique., , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (1996)An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits., , and . Asian Test Symposium, page 22-. IEEE Computer Society, (1997)Low-capture-power test generation for scan-based at-speed testing., , , , , , and . ITC, page 10. IEEE Computer Society, (2005)