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Disambiguation of "Wen, Xiaoqing"

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A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits.

, , , , and . IEICE Transactions, 91-D (3): 667-674 (2008)

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Dr. -Ing. Christoph Wenzel University of Stuttgart

Florian Wendt University of Stuttgart

Dr. rer. nat. Tim Wendlandt University of Stuttgart

Ingeborg Wenger University of Stuttgart

Florian Wenz University of Stuttgart

 

Other publications of authors with the same name

Embedded Tutorial on Low Power Test., and . European Test Symposium, page 202-210. IEEE Computer Society, (2007)Fault Diagnosis of Physical Defects Using Unknown Behavior Model., , , and . J. Comput. Sci. Technol., 20 (2): 187-194 (2005)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. VLSI Syst., 24 (1): 38-49 (2016)A Testable Design of Logic Circuits under Highly Observable Condition., and . IEEE Trans. Computers, 41 (5): 654-659 (1992)CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing., , , , , , , and . Asian Test Symposium, page 99-104. IEEE Computer Society, (2009)Fault Diagnosis for Physical Defects of Unknown Behaviors., , , and . Asian Test Symposium, page 236-241. IEEE Computer Society, (2003)Session Summary III: Power-Aware Testing: Present and Future., and . Asian Test Symposium, page 220. IEEE Computer Society, (2012)Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (3): 499-512 (2016)VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG., , , , , , and . IEEE Design & Test of Computers, 25 (2): 122-130 (2008)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits., , , , and . IEICE Transactions, 91-D (3): 667-674 (2008)