%0 Journal Article %1 journals/ieicet/WenTK95 %A Wen, Xiaoqing %A Tamamoto, Hideo %A Kinoshita, Kozo %D 1995 %J IEICE Transactions %K dblp %N 7 %P 830-838 %T Testing of k-FR Circuits under Highly Observable Condition. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet78d.html#WenTK95 %V 78-D

@article{journals/ieicet/WenTK95, added-at = {2011-08-17T00:00:00.000+0200}, author = {Wen, Xiaoqing and Tamamoto, Hideo and Kinoshita, Kozo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a37e323a6e029670a422a878e0594a23/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e78-d_7_830}, interhash = {b4d010dab8f4fbfc47ea9c92205f0131}, intrahash = {a37e323a6e029670a422a878e0594a23}, journal = {IEICE Transactions}, keywords = {dblp}, number = 7, pages = {830-838}, timestamp = {2016-02-02T09:46:13.000+0100}, title = {Testing of k-FR Circuits under Highly Observable Condition.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet78d.html#WenTK95}, volume = {78-D}, year = 1995 }