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Disambiguation of "Kinoshita, Kozo"

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A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths.

, , , and . VLSI Design, page 82-87. IEEE Computer Society, (1997)

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Other publications of authors with the same name

Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs., , , and . VLSI Design, page 329-334. IEEE Computer Society, (2003)Extended selection of switching target faults in CONT algorithm for test generation., and . J. Electronic Testing, 1 (3): 183-189 (1990)Cascade Realization of 3-Input 3-Output Conservative Logic Circuits., and . IEEE Trans. Computers, 27 (3): 214-221 (1978)Realization of Minimum Circuits with Two-Input Conservative Logic Elements., and . IEEE Trans. Computers, 27 (8): 749-752 (1978)On Test Generation with A Limited Number of Tests., , and . Great Lakes Symposium on VLSI, page 12-15. IEEE Computer Society, (1999)Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits., , and . Asian Test Symposium, page 121-126. IEEE Computer Society, (1999)IDDQ Current Dependency on Test Vectors and Bridging Resistance., , and . Asian Test Symposium, page 158-163. IEEE Computer Society, (1999)A BIST Circuit for IDDQ Tests., , , , , and . Asian Test Symposium, page 390-395. IEEE Computer Society, (2003)A high-speed IDDQ sensor implementation., , , and . Asian Test Symposium, page 356-361. IEEE Computer Society, (2000)An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits., , and . Asian Test Symposium, page 22-. IEEE Computer Society, (1997)