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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

, , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Robust platform design in advanced VLSI technologies., , , and . CICC, page 23-30. IEEE, (2005)Multi-Frequency, Multi-Phase Scan Chain., and . ITC, page 323-330. IEEE Computer Society, (1994)Framework for massively parallel testing at wafer and package test., and . ICCD, page 328-334. IEEE Computer Society, (2009)Panel 4A: Apprentice - VTS edition: Season 3.. VTS, page 129. IEEE Computer Society, (2010)Sequential Element Design With Built-In Soft Error Resilience., , , , , , , , and . IEEE Trans. VLSI Syst., 14 (12): 1368-1378 (2006)Soft Error Resilient System Design through Error Correction., , , , and . VLSI-SoC (Selected Papers), volume 249 of IFIP, page 143-156. Springer, (2006)XPAND: An Efficient Test Stimulus Compression Technique., and . IEEE Trans. Computers, 55 (2): 163-173 (2006)Session Abstract., and . VTS, page 292-293. IEEE Computer Society, (2006)XMAX: X-Tolerant Architecture for MAXimal Test Compression., and . ICCD, page 326-330. IEEE Computer Society, (2003)X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction., and . ITC, page 311-320. IEEE Computer Society, (2002)