Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Low-Transition Test Pattern Generation for BIST-Based Applications., , and . IEEE Trans. Computers, 57 (3): 303-315 (2008)Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain., , , , , and . Proceedings of the IEEE, 102 (8): 1207-1228 (2014)BISA: Built-in self-authentication for preventing hardware Trojan insertion., and . HOST, page 45-50. IEEE Computer Society, (2013)Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals., , and . HOST, page 3-7. IEEE Computer Society, (2008)Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis., , , and . DFT, page 87-95. IEEE Computer Society, (2008)Test and Diagnosis for Small-Delay Defects., , and . Springer, (2011)Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (5): 760-773 (2010)Pattern Generation and Estimation for Power Supply Noise Analysis., , and . VTS, page 439-444. IEEE Computer Society, (2005)Test-Pattern Grading and Pattern Selection for Small-Delay Defects., , and . VTS, page 233-239. IEEE Computer Society, (2008)Session Abstract., and . VTS, page 292-293. IEEE Computer Society, (2006)