%0 Journal Article %1 journals/tc/NouraniTA08 %A Nourani, Mehrdad %A Tehranipoor, Mohammad %A Ahmed, Nisar %D 2008 %J IEEE Trans. Computers %K dblp %N 3 %P 303-315 %T Low-Transition Test Pattern Generation for BIST-Based Applications. %U http://dblp.uni-trier.de/db/journals/tc/tc57.html#NouraniTA08 %V 57

@article{journals/tc/NouraniTA08, added-at = {2015-12-22T00:00:00.000+0100}, author = {Nourani, Mehrdad and Tehranipoor, Mohammad and Ahmed, Nisar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28dd67d6963a526cccffa1841907cef2e/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2007.70794}, interhash = {00339a554ffc793168e873f0bf2d459a}, intrahash = {8dd67d6963a526cccffa1841907cef2e}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 3, pages = {303-315}, timestamp = {2016-02-02T02:38:32.000+0100}, title = {Low-Transition Test Pattern Generation for BIST-Based Applications.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc57.html#NouraniTA08}, volume = 57, year = 2008 }