%0 Journal Article %1 journals/tcad/YilmazCT10 %A Yilmaz, Mahmut %A Chakrabarty, Krishnendu %A Tehranipoor, Mohammad %D 2010 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 5 %P 760-773 %T Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#YilmazCT10 %V 29

@article{journals/tcad/YilmazCT10, added-at = {2011-01-12T00:00:00.000+0100}, author = {Yilmaz, Mahmut and Chakrabarty, Krishnendu and Tehranipoor, Mohammad}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25d7f9cbe04e347b275ac343aeaedd695/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2010.2043591}, interhash = {fca9b554cdbb8accadbe4e98df003eef}, intrahash = {5d7f9cbe04e347b275ac343aeaedd695}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 5, pages = {760-773}, timestamp = {2016-02-02T10:07:57.000+0100}, title = {Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#YilmazCT10}, volume = 29, year = 2010 }