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Recent Advances and New Avenues in Hardware-Level Reliability Support., , , and . IEEE Micro, 25 (6): 18-29 (2005)Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)The resilience wall: Cross-layer solution strategies., , , , , , , , , and 3 other author(s). VLSI-DAT, page 1-11. IEEE, (2014)Cross layer resiliency in real world., , , and . DATE, page 1. European Design and Automation Association, (2014)Cross-layer resilience challenges: Metrics and optimization., , and . DATE, page 1029-1034. IEEE, (2010)Efficient Seed Utilization for Reseeding based Compression., and . VTS, page 232-240. IEEE Computer Society, (2003)Bist Reseeding with very few Seeds., , and . VTS, page 69-76. IEEE Computer Society, (2003)Design for Testability and Testing of IEEE 1149.1 Tap Controller., , and . VTS, page 247-252. IEEE Computer Society, (2002)Fault Escapes in Duplex Systems., , and . VTS, page 453-458. IEEE Computer Society, (2000)ELF-Murphy Data on Defects and Test Sets., , , , , , , and . VTS, page 16-22. IEEE Computer Society, (2004)