PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Makar, Samy"

Author of the publication

copydeleteadd this publication to your clipboard
Design for Testability and Testing of IEEE 1149.1 Tap Controller.

, , and . VTS, page 247-252. IEEE Computer Society, (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Makar, Samy
add a person with the name Makar, Samy
 

Other publications of authors with the same name

On the Testing of Multiplexers., and . ITC, page 669-679. IEEE Computer Society, (1988)The critical path for multiple faults., and . ICCAD, page 162-165. IEEE Computer Society, (1989)Design for Testability and Testing of IEEE 1149.1 Tap Controller., , and . VTS, page 247-252. IEEE Computer Society, (2002)A layout-based approach for ordering scan chain flip-flops.. ITC, page 341-347. IEEE Computer Society, (1998)Floating Point Fault Tolerance with Backward Error Assertions., , , , and . IEEE Trans. Computers, 44 (2): 302-311 (1995)ATPG for scan chain latches and flip-flops., and . VTS, page 364-369. IEEE Computer Society, (1997)Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study., , , and . ITC, page 1-10. IEEE Computer Society, (2013)Probability models for pseudorandom test sequences., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 7 (1): 68-74 (1988)Functional Tests for Scan Chain Latches., and . ITC, page 606-615. IEEE Computer Society, (1995)Checking experiments to test latches., and . VTS, page 196-201. IEEE Computer Society, (1995)