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%0 Journal Article
%1 journals/tcad/McCluskeyMMW88
%A McCluskey, Edward J.
%A Makar, Samy
%A Mourad, Samiha
%A Wagner, Kenneth D.
%D 1988
%J IEEE Trans. on CAD of Integrated Circuits and Systems
%K dblp
%N 1
%P 68-74
%T Probability models for pseudorandom test sequences.
%U http://dblp.uni-trier.de/db/journals/tcad/tcad7.html#McCluskeyMMW88
%V 7
@article{journals/tcad/McCluskeyMMW88,
added-at = {2016-03-18T00:00:00.000+0100},
author = {McCluskey, Edward J. and Makar, Samy and Mourad, Samiha and Wagner, Kenneth D.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ab99954a81d6ff20e1586c4f28d9ca45/dblp},
ee = {http://dx.doi.org/10.1109/43.3131},
interhash = {cbc374ca430480d6415a286f32c6c304},
intrahash = {ab99954a81d6ff20e1586c4f28d9ca45},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
keywords = {dblp},
number = 1,
pages = {68-74},
timestamp = {2016-03-19T10:32:45.000+0100},
title = {Probability models for pseudorandom test sequences.},
url = {http://dblp.uni-trier.de/db/journals/tcad/tcad7.html#McCluskeyMMW88},
volume = 7,
year = 1988
}
