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Recent Advances and New Avenues in Hardware-Level Reliability Support., , , and . IEEE Micro, 25 (6): 18-29 (2005)Fast Run-Time Fault Location in Dependable FPGA-Based Applications., , and . DFT, page 206-214. IEEE Computer Society, (2001)Testing Digital Circuits with Constraints., , and . DFT, page 195-206. IEEE Computer Society, (2002)Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)ELF-Murphy Data on Defects and Test Sets., , , , , , , and . VTS, page 16-22. IEEE Computer Society, (2004)Probabilistic analysis of Gallager B faulty decoder., , , , and . ICC, page 7019-7023. IEEE, (2012)A new era of computing: Are you "ready now" to build a smarter and secured enterprise?, , , , and . ISQED, page 1. IEEE, (2014)Efficient Seed Utilization for Reseeding based Compression., and . VTS, page 232-240. IEEE Computer Society, (2003)Bist Reseeding with very few Seeds., , and . VTS, page 69-76. IEEE Computer Society, (2003)Design for Testability and Testing of IEEE 1149.1 Tap Controller., , and . VTS, page 247-252. IEEE Computer Society, (2002)