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Disambiguation of "Seomun, Jun"

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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

, , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Jun Chen University of Stuttgart

Jun Chen University of Stuttgart

Mathias Jung University of Stuttgart

Jong Hyun Jung University of Stuttgart

Dr. Kerstin Jung University of Stuttgart

 

Other publications of authors with the same name

Frequency and yield optimization using power gates in power-constrained designs., , , , , , and . ISLPED, page 121-126. ACM, (2009)Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)Bounded potential slack: enabling time budgeting for dual-Vt allocation of hierarchical design., , and . ASP-DAC, page 581-586. IEEE, (2010)Skewed Flip-Flop Transformation for Minimizing Leakage in Sequential Circuits., , and . DAC, page 103-106. IEEE, (2007)Synthesis and implementation of active mode power gating circuits., , and . DAC, page 487-492. ACM, (2010)Maximizing Frequency and Yield of Power-Constrained Designs Using Programmable Power-Gating., , , and . IEEE Trans. VLSI Syst., 20 (10): 1885-1890 (2012)Synthesis of Active-Mode Power-Gating Circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (3): 391-403 (2012)Skewed Flip-Flop and Mixed-Vt Gates for Minimizing Leakage in Sequential Circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 27 (11): 1956-1968 (2008)Design and Optimization of Power-Gated Circuits With Autonomous Data Retention., and . IEEE Trans. VLSI Syst., 19 (2): 227-236 (2011)Early-life-failure detection using SAT-based ATPG., , , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2013)