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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

, , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Gate-Oxide Early Life Failure Prediction., , , and . VTS, page 111-118. IEEE Computer Society, (2008)Early-life-failure detection using SAT-based ATPG., , , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2013)Exact dynamic stiffness matrix of non-symmetric thin-walled beams on elastic foundation using power series method., , and . Advances in Engineering Software, 36 (8): 518-532 (2005)A study on inspection robot wheel to pass an obstacle on a four conductor transmission line., , , , and . ISR, page 1-2. IEEE, (2013)Cross-layer error resilience for robust systems., , , , , and . ICCAD, page 177-180. IEEE, (2010)Active-clamp forward converter with asymmetric transformer turns for reducing transformer DC offset current., , , , and . IECON, page 204-209. IEEE, (2012)Robust System Design to Overcome CMOS Reliability Challenges., , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 1 (1): 30-41 (2011)Cost-effective Design of Magnetically Coupled Power Transfer System with Standby Mode., , and . IECON, page 5746-5751. IEEE, (2019)System-Level Power Analysis of a Multicore Multipower Domain Processor With ON-Chip Voltage Regulators., , , , , , and . IEEE Trans. VLSI Syst., 24 (12): 3468-3476 (2016)Gate-oxide early-life failure identification using delay shifts., , , , and . VTS, page 69-74. IEEE Computer Society, (2010)