%0 Conference Paper %1 conf/cicc/KimSKDCKSBM13 %A Kim, Young Moon %A Seomun, Jun %A Kim, Hyung-Ock %A Do, Kyung Tae %A Choi, Jung Yun %A Kim, Kee Sup %A Sauer, Matthias %A Becker, Bernd %A Mitra, Subhasish %B CICC %D 2013 %I IEEE %K dblp %P 1-4 %T Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2013.html#KimSKDCKSBM13

@inproceedings{conf/cicc/KimSKDCKSBM13, added-at = {2013-11-14T00:00:00.000+0100}, author = {Kim, Young Moon and Seomun, Jun and Kim, Hyung-Ock and Do, Kyung Tae and Choi, Jung Yun and Kim, Kee Sup and Sauer, Matthias and Becker, Bernd and Mitra, Subhasish}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24622e6c44b7fa28d94f192633ec93a0a/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2013}, ee = {http://dx.doi.org/10.1109/CICC.2013.6658544}, interhash = {bbb51182c102cac9dac2177481fbf6e7}, intrahash = {4622e6c44b7fa28d94f192633ec93a0a}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2016-02-02T12:54:48.000+0100}, title = {Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2013.html#KimSKDCKSBM13}, year = 2013 }