%0 Conference Paper %1 conf/dft/Al-YamaniMM02 %A Al-Yamani, Ahmad A. %A Mitra, Subhasish %A McCluskey, Edward J. %B DFT %D 2002 %I IEEE Computer Society %K dblp %P 195-206 %T Testing Digital Circuits with Constraints. %U http://dblp.uni-trier.de/db/conf/dft/dft2002.html#Al-YamaniMM02 %@ 0-7695-1831-1

@inproceedings{conf/dft/Al-YamaniMM02, added-at = {2014-11-10T00:00:00.000+0100}, author = {Al-Yamani, Ahmad A. and Mitra, Subhasish and McCluskey, Edward J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27ab0fa7a1a0a73d8d2df11068900d445/dblp}, booktitle = {DFT}, crossref = {conf/dft/2002}, ee = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2002.1173516}, interhash = {53f4a0f78fa278d61b61c46458c75bd6}, intrahash = {7ab0fa7a1a0a73d8d2df11068900d445}, isbn = {0-7695-1831-1}, keywords = {dblp}, pages = {195-206}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T12:14:00.000+0100}, title = {Testing Digital Circuits with Constraints.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2002.html#Al-YamaniMM02}, year = 2002 }