%0 Conference Paper %1 conf/iccd/BabaK09 %A Baba, A. Hakan %A Kim, Kee Sup %B ICCD %D 2009 %I IEEE Computer Society %K dblp %P 328-334 %T Framework for massively parallel testing at wafer and package test. %U http://dblp.uni-trier.de/db/conf/iccd/iccd2009.html#BabaK09 %@ 978-1-4244-5029-9

@inproceedings{conf/iccd/BabaK09, added-at = {2019-02-11T00:00:00.000+0100}, author = {Baba, A. Hakan and Kim, Kee Sup}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2149baa7c0ceab8644d6b22713fb18baf/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/2009}, ee = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2009.5413134}, interhash = {556ec052a6e2b158d4625f41322242fd}, intrahash = {149baa7c0ceab8644d6b22713fb18baf}, isbn = {978-1-4244-5029-9}, keywords = {dblp}, pages = {328-334}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T20:11:05.000+0200}, title = {Framework for massively parallel testing at wafer and package test.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2009.html#BabaK09}, year = 2009 }