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Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection.

D. Lin, T. Hong, Y. Li, E. S, S. Kumar, F. Fallah, N. Hakim, D. Gardner, and S. Mitra. IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (10): 1573-1590 (2014)

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M.Sc. Yunxuan Li University of Stuttgart

Yu Li University of Stuttgart

Zheng Li University of Stuttgart

Jie Li University of Stuttgart

Li Zhong University of Stuttgart

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Concurrent autonomous self-test for uncore components in system-on-chips.Y. Li, O. Mutlu, D. Gardner, and S. Mitra. VTS, page 232-237. IEEE Computer Society, (2010)Protecting Page Tables from RowHammer Attacks using Monotonic Pointers in DRAM True-Cells.X. Wu, T. Sherwood, F. Chong, and Y. Li. ASPLOS, page 645-657. ACM, (2019)Cross-layer error resilience for robust systems.L. Leem, H. Cho, H. Lee, Y. Kim, Y. Li, and S. Mitra. ICCAD, page 177-180. IEEE, (2010)Two-Stream Multi-Task Network for Fashion Recognition.P. Li, Y. Li, X. Jiang, and X. Zhen. ICIP, page 3038-3042. IEEE, (2019)Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection.D. Lin, T. Hong, Y. Li, E. S, S. Kumar, F. Fallah, N. Hakim, D. Gardner, and S. Mitra. IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (10): 1573-1590 (2014)The resilience wall: Cross-layer solution strategies.S. Mitra, P. Bose, E. Cheng, C. Cher, H. Cho, R. Joshi, Y. Kim, C. Lefurgy, Y. Li, K. Rodbell and 3 other author(s). VLSI-DAT, page 1-11. IEEE, (2014)Robust System Design.S. Mitra, H. Cho, T. Hong, Y. Kim, H. Lee, L. Leem, Y. Li, D. Lin, E. Mintarno, D. Mui and 4 other author(s). IPSJ Trans. System LSI Design Methodology, (2011)Overcoming Early-Life Failure and Aging for Robust Systems.Y. Li, Y. Kim, E. Mintarno, D. Gardner, and S. Mitra. IEEE Design & Test of Computers, 26 (6): 28-39 (2009)Special session 11C: Young professionals in test - Elevator talks.A. Sanyal, and Y. Li. VTS, page 1. IEEE Computer Society, (2014)Graph Neural Based End-to-end Data Association Framework for Online Multiple-Object Tracking.X. Jiang, P. Li, Y. Li, and X. Zhen. CoRR, (2019)