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#SAT-based vulnerability analysis of security components - A case study.

, , , , , , and . DFT, page 49-54. IEEE Computer Society, (2012)

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Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics., , , , , , , , and . CICC, page 1-4. IEEE, (2013)Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths., , , , and . DATE, page 448-453. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Search Space Reduction for Low-Power Test Generation., , , , and . Asian Test Symposium, page 171-176. IEEE Computer Society, (2013)Identification of critical variables using an FPGA-based fault injection framework., , , , and . VTS, page 1-6. IEEE Computer Society, (2013)Accurate Computation of Sensitizable Paths Using Answer Set Programming., , , , , and . LPNMR, volume 8148 of Lecture Notes in Computer Science, page 92-101. Springer, (2013)On Metrics to Quantify the Inter-Device Uniqueness of PUFs., , and . IACR Cryptology ePrint Archive, (2016)Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility, , , , , and . Proceedings of the 37th ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, (23-25 02 2025)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. (2021)Security, Reliability and Test Aspects of the RISC-V Ecosystem, , , , , , , , , and 6 other author(s). 2021 IEEE European Test Symposium (ETS), page 1-10. Piscataway, IEEE, (2021)On secure data flow in reconfigurable scan networks, , , , , , , and . 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1016-1021. IEEE, (2019)