S. Dong, T. Haist, W. Osten, T. Ruppel, and O. Sawodny. Applied optics, (2012)39 cites: https://scholar.google.com/scholar?cites=18374474749701692653&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, and .... … Measurement Systems for …, (2007)3 cites: https://scholar.google.com/scholar?cites=13122883090839124938&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and H. Tiziani. Journal of Optics A: Pure …, (1999)15 cites: https://scholar.google.com/scholar?cites=8162882387938461535&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
L. Hänel, Y. Elogail, D. Schwarz, I. Fischer, and J. Schulze. 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), page 0027-0031. (May 2018)